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Information × Registration Number 0214U008827, 0108U002445 , R & D reports Title Development and creation of diagnostic complex for testing of microwave diodes on the basis of wide-gap semiconductors. popup.stage_title Head Konakova Raisa Vasilevna, Registration Date 07-11-2014 Organization V. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine popup.description2 Scientific report consists of an introduction, one part and conclusions. The report has 23 pages of typescript, including 16 pages of main text, 10 figures, 1 table, and a list of links of 21 items. The object of this work is the study of methods of diagnosing microwave diodes based on wide-gap semiconductors and thermal resistances of optoelectronic products. The aim is to develop and create a constructive part of complex diagnostic tests for microwave diodes based on wide-gap semiconductors - Voltage-current for 12-bit DAC. As a result of the work developed technical requirements for pulse shaper complex diagnostic tests for microwave diodes based on wide-gap semiconductors. Developed and tested in the experiment variant pulse shaper. Keywords: Gunn, IMPATT diode, PIN diode Product Description popup.authors Конакова Р.В. Кудрик Я.Я. Шеремет В.М. Шинкаренко В.В. popup.nrat_date 2020-04-02 Close