Registration Number
0214U008827,
0108U002445
, R & D reports
Title
Development and creation of diagnostic complex for testing of microwave diodes on the basis of wide-gap semiconductors.
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Head
Konakova Raisa Vasilevna,
Registration Date
07-11-2014
Organization
V. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine
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Scientific report consists of an introduction, one part and conclusions. The report has 23 pages of typescript, including 16 pages of main text, 10 figures, 1 table, and a list of links of 21 items. The object of this work is the study of methods of diagnosing microwave diodes based on wide-gap semiconductors and thermal resistances of optoelectronic products. The aim is to develop and create a constructive part of complex diagnostic tests for microwave diodes based on wide-gap semiconductors - Voltage-current for 12-bit DAC. As a result of the work developed technical requirements for pulse shaper complex diagnostic tests for microwave diodes based on wide-gap semiconductors. Developed and tested in the experiment variant pulse shaper. Keywords: Gunn, IMPATT diode, PIN diode
Product Description
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Конакова Р.В.
Кудрик Я.Я.
Шеремет В.М.
Шинкаренко В.В.
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2020-04-02
