Registration Number
0216U001745,
0115U005035
, R & D reports
Title
Development and creation of high-resolution X-ray methods and equipment for certification of nanomaterials
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Head
Kladko Vasyl Petrovych, Доктор фізико-математичних наук
Registration Date
31-03-2016
Organization
Institute of Semiconductor Physics of National Academy of Sciences of Ukrain
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Influence of intrinsic mechanic strain on diffusion processes is established. Methods of full width on half maximum of diffraction curves and method of dufuse scatering of X-ray were used to get information about structure defects: type, size and concentration. Method of deformation state control for materials with complex crystal lattice in temperature range (70-1000К) was realised.
Product Description
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Єфанов Олександр Миколайович
Гудименко Олександр Йосипович
Кривий Сергій Борисович
Максименко Зоя Василівна
Поліщук Юлія Олегівна
Сафрюк Надія Володимирівна
Слободян Микола Васильович
Стадник Олександр Анатолійович
Станчу Григорій Вікторович
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2020-04-02
