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Information × Registration Number 0216U001745, 0115U005035 , R & D reports Title Development and creation of high-resolution X-ray methods and equipment for certification of nanomaterials popup.stage_title Head Kladko Vasyl Petrovych, Доктор фізико-математичних наук Registration Date 31-03-2016 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Influence of intrinsic mechanic strain on diffusion processes is established. Methods of full width on half maximum of diffraction curves and method of dufuse scatering of X-ray were used to get information about structure defects: type, size and concentration. Method of deformation state control for materials with complex crystal lattice in temperature range (70-1000К) was realised. Product Description popup.authors Єфанов Олександр Миколайович Гудименко Олександр Йосипович Кривий Сергій Борисович Максименко Зоя Василівна Поліщук Юлія Олегівна Сафрюк Надія Володимирівна Слободян Микола Васильович Стадник Олександр Анатолійович Станчу Григорій Вікторович popup.nrat_date 2020-04-02 Close