Registration Number
0219U100523,
0117U006157
, R & D reports
Title
Creation of bases of phase-shift single-axis diffractometry of multi-parameter systems
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Head
Lzunov Viacheslav V., Доктор фізико-математичних наук
Registration Date
18-02-2019
Organization
G. V. Kurdyumov IMPh of the N.A.S.U.
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A semi-phenomenological simplified model and a method of diagnostics on a phase variational principle with the use of deformation dependencies (DD) of total integrated intensity of dynamic diffraction (TIIDD) in crystals with defects, without additional measurements on reference samples, was created.
It is shown that the use of DD TIIDD derived from a single Lauer-reflex of X-rays in the approach of a "thin" crystal allows in many cases to obtain the same amount of information as when using the TIIDD thick dependences obtained with the use of several reflexes in the approximations of "thin" and "thick" crystals. This is achieved by using the phase-oriented approach, which is in this case in the purposeful variation of diffraction conditions and areas of macrodeformation.
The analysis of the diagnostic possibilities of the DD TIIDD method for single crystals with microdefects was conducted in the case when the diffused component of TIIDD can be commensurate with its coherent component or significantly exceed it. It is shown that in this case, DD TIIDD is abnormally sensitive and informative when used to determine the characteristics of microdefects in multiparameter monocrystalline systems. It has been demonstrated that the simplified dispersion phase variational heuristic model of the DD TIIDD allows for multiparameter diagnostics of chaotic microdefects distributed in the crystal.
Product Description
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2020-04-02
