Registration Number
0220U002028,
0118U002048
, R & D reports
Title
Modelling the structure, creating and studying the properties of monochromators for new X-ray sources
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Head
Zubarev Evhen,
Registration Date
10-02-2020
Organization
The Kharkov state polytechnical university
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Object of study: Dispersing elements with ultra-high X-ray reflectance to form photons in the energy range 0.2-50 keV. Purpose: the controlled creation of new dispersing elements, the development of beam beam based on them for new sources of X-rays. Research methods: Theoretical study - methods of Jacobian matrices, Peresada-Sirkin method, multipole decompositions, calculation of electrostatic multipoles of specific physical systems. Experimental study - X-ray fluorescence spectrometry, X-ray diffractometry, X-ray reflectometry, electron microscopy. Vacuum system for producing monochromators based on thick films of fulerite is equipped with a quasi-closed volume cell with an automatic heating system, which uses six independent proportional-integral-differentiating regulators with thermo-compensation of cold junction based on the 60 MP regulator of temperature controller It has been established experimentally that the roughness of the fullerene layers on the mica surface (111) depends not only on the application velocity but also on the stability of the te-temperature over the substrate plane. In the absence of temperature stability, smooth layers of fullerene appear only in the central area of the substrate, and at the periphery, layers of increased roughness (roughness at the level of several micrometers) grow. The experiments allowed us to establish that obtaining a mirror smoothness of the layers along the entire plane of the substrate requires stabilization of the temperature at the level of ± 2C at a deposition rate of no more than 5-7 mkm per h. The structural perfection of the layers was studied by measuring the half-width of the rocking curves at an irradiation area of at least 10mm x 10mm. It has been experimentally established that the smoothness of the surfaces of the layers does not yet ensure their structural perfection. In some cases, at areas with a surface roughness of more 0.1 mkm, the structural perfection was poor, that is, the half-width of the rocking curve exceeded 1-3 degrees. In general, it has been found that obtaining a given level of structural perfection and roughness requires the independent implementation of ex-perimeter regimes. X-ray diffractometer in the mode teta-2teta scanning made quantitative measurements of the integral intensity of seven in-rows of prints (hhh) of epitaxial fullerene layers. The experimental magnitude of the atomic form factor Fhhh of the prints (hhh) for the fu-lerene molecule was determined. Comparison of the experimental values of the atomic form factor with the Fhhh calculations in the rotation model made it possible to quantify the fundamental parameter diameter of the fullerene molecule 7.04A. A new approach to graphene and carbon nano tubes CNT defects has been developed: adatoms, islets, nanocrystals and intercalants as interacting dipoles. The functionalization (adsorption) of graphene and (CNT) is investigated in the case of charge transfer between the functionalizing molecule and the substrate (graphene, CNT).
Product Description
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Батурін Олексій Анатолійович
Борисова Светлана Серофимівна
Зубарєв Євгеній Миколайович
Ликах Віктор Олександрович
Мамон Валентин Васильович
Михайлов Ігор Федорович
Михайлов Антон Ігорович
Севрюкова Вікторія Анатоліївна
Сиркін Євген Соломонович
Суровіцкий Сергій Вікторович
Фоміна Лариса Петрівна
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2020-04-02
