Registration Number
0225U002813,
(0120U102191)
, R & D reports
Title
Diffraction in the field of anomalous dispersion of X-rays: New opportunities in the diagnosis of nanostructures
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Дифракція в області аномальної дисперсії Х-променів: Нові можливості в діагностиці наноструктур
Head
Kladko Vasyl P., Доктор фізико-математичних наук
Registration Date
07-04-2025
Organization
V. Lashkaryov Institute of Semiconductor Physics of National Academy
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The development of diffraction methods for the diagnosis of nanomaterials in a wide range of changes in their dimensions and crystalline structure, the study of the possibility of changing the electrophysical parameters by controlled influence on the deformation state of nanosystems.
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The effect of ultrasonic vibrations on the transport characteristics of AlGaN/GaN heterostructures has been investigated. It has been found that the treatment of the sample with ultrasonic vibrations leads to acoustic conductivity (PAC), which is significant up to room temperatures. It has been shown that the PAC transient characteristics correlate with the effect of persistent photoconductivity (PPC) caused by deep-level impurities.
t is shown that the dynamic deformation method will be a useful and informative tool for determining transport (2DEG) in AlGaN/GaN heterostructures.
The methodological basis of structural studies has been developed and supplemented based on the use of a modern complex of equipment for high-resolution X-ray diffractometric and reflectometric diagnostics.
Product Description
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Hudymenko Oleksandr Yo.
Liubchenko Oleksii I.
Maksymenko Zoia V.
Polischuk Yuliia O.
Safriuk Nadiia V.
Slobodian Mykola V.
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2025-04-07
