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Інформація × Реєстраційний номер 2115U002057, Матеріали видань та локальних репозитаріїв Категорія Thesis Назва роботи Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance Автор Дата публікації 01-01-2015 Постачальник інформації Сумський державний університет Першоджерело http://essuir.sumdu.edu.ua/handle/123456789/42581 Видання Sumy State University Опис The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance. Додано в НРАТ 2025-05-12 Закрити