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Registration Number

0205U006476, 0104U010073 , R & D reports

Title

The complex of methods development for practical diagnostic and support of modern technologies for nanostructures production with specified physical and physico-chemical parameters and characteristics.

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Head

Prokopenko Igor V.,

Registration Date

15-11-2005

Organization

Institute of Semiconductor Physics of National Academy of Sciences of Ukrain

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Theoretical analysis of the X-ray diffraction peculiarities in semiconductor superlattice structures containing quantum dots has been curried out. X-ray technique for nondestructive composition analysis of semiconductor nanostructures was improved.

Product Description

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2020-04-02