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Information × Registration Number 0208U002027, 0107U005772 , R & D reports Title Creation of diagnostic complex for control and attestation of semiconductor materials and structures by X-ray diffraction and AFM methods popup.stage_title Head Prokopenko Igor V., Registration Date 14-01-2008 Organization V.Lashkaryov Institute of Semiconductor Physics National Academy of Sciences of Ukraine popup.description2 It is developed new theoretical model of diffraction of X-rays in difficult systems with sorts defective structure and the software for researches of structural properties low-dimensional systems is created on its basis. Realize also it is adapted for diagnostics of electric and mechanical properties semi-conductor nanostructure sond methods of the advanced atomno-power microscopy scanning of microscopy and nanoinductors. Product Description popup.authors popup.nrat_date 2020-04-02 Close