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Information × Registration Number 0209U002660, 0107U009830 , R & D reports Title Detecting of characteristic of defectiveness of flat-layered junctions with cracks based on the new models their dynamic load popup.stage_title Head Voytko Myron Vasylyovych, Registration Date 11-03-2009 Organization Karpenko Physico-Mechanical Institute of the National Academy of Sciences of Ukraine popup.description2 The problem of the SH elastic wave diffraction for the finite (semi-infinite) crack at the plane interface between two dissimilar elastic perfectly joined isotropic materials is solved. The harmonic point source wave incidence is considered. The problem is formulated in terms of the Wiener-Hopf equation which is solved by a method of factorization. For the high-frequency approximation it is received the solution of this equation. The results of numerical calculation are presented for diffracted far field patterns. The peculiarities of the far field distribution for different position of source are analyzed. Product Description popup.authors popup.nrat_date 2020-04-02 Close