Search academic texts

Information × Registration Number 0211U001548, 0109U002418 , R & D reports Title Development of high-sensible method of X-ray fluorescent analysis of material content using X-ray optical settings popup.stage_title Head Mikhailov Igor, Registration Date 10-02-2011 Organization National technical university "Kharkiv polytechnic institute" popup.description2 Object of investigation is high-aperture X-ray optical schemes with abnormal close to specimen positioning the source; secondary radiators for contrast enhancement of analytical lines in specific ranges of X-ray spectrum. The aim of the work is development of means for excitation of fluorescent radiation using secondary radiators and concentrating the X-radiation. Methods of investigation: X-ray fluorescent spectrometry, X-ray diffraction, X-ray reflectometry. Scientific and practical importance of the results obtained is in development of means for excitation of fluorescent radiation using secondary radiators and concentation of X-ray radiation. As close as possible positioning the source of preliminary radiation to specimen allowed increasing the efficiency of devices, practically rid of scattering radiation background at all, by two-three orders enhancing the analytical line contrast. The created model of the secondary radiator gives the possibility to provide superhigh sensibility level at a low-power X-ray tube. The results of standard mixtures of Pb and Cr in water are at least 20 times better than these obtained by conventional RFA method and approach to these obtaned by the most sensible method of analysis of solutions - atomic-absorption microscopy. Product Description popup.authors Бабенко Ігор Миколайович Батурін Олексій Анатолійович Борисова Світлана Серафимівна Малихін Сергій Володимирович Медведєв Сергій Анатолійович Пінегин Володимир Іванович Соболь Олег Валентинович Фоміна Лариса Петрівна popup.nrat_date 2020-04-02 Close