Search academic texts

Information × Registration Number 0212U004753, 0110U004656 , R & D reports Title Development of method and equipment for X-ray ultra-acoustic express multiparametric diagnostics of nanosystems. popup.stage_title Head Olikh Jaroslav Mykhaylovych, Registration Date 01-03-2012 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 The experimental method of X-ray-ultrasonic integral diffractometry in different geometries of diffraction for thin crystals (subsurface layers) was developed. The method takes into account structurally sensitive contribution of diffuse component of diffraction and dependence of this contribution as from type of defects and their characteristics as from ultrasonic wave's parameters. Product Description popup.authors Єфанов Олександр Миколайович Гудименко Олександр Йосипович Кладько Василь Петрович Кучук Андріан Володимирович МаксименкоЗоя Василівна Мачулін Володимир Федорович Проскуренко Наталія Миколаївна Сафрюк Надія Володимирівна Стадник Олександр Анатолійович popup.nrat_date 2020-04-02 Close