Search academic texts

Information × Registration Number 0213U007249, 0108U004840 , R & D reports Title Development and realization of the metrological complex for diagnostic of nanoelectronics component by scanning probe microscopy popup.stage_title Створення метрологічного комплексу для діагностики та сертифікації компонентної бази наноелектроніки та суміжних нанотехнологій Head Prokopenko Igor, Registration Date 30-04-2013 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 The novel nanometrological complex for diagnostic at submicron and subnanometer levels of new materials and devices for nanoelectronics, plasmonics, nanomedicine and biotechnology was developed basing on the multifunctional scanning probe microscope Product Description popup.authors Литвин О.С. Литвин П.М. Прокопенко І.В. popup.nrat_date 2020-04-02 Close