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Information × Registration Number 0222U000616, 0121U111717 , R & D reports Title Quasioptical scale modeling of the influence of radiation-induced localized defects in metals and alloys on the optical ellipsometry data popup.stage_title Head Kolenov Ivan V., Registration Date 14-01-2022 Organization Institute of Electrophysics and Radiation Technologies of the National Academy of Sciences of Ukraine popup.description2  At this work, the modification of the existing terahertz ellipsometer and reflectometer was performed to study the effect of radiation-induced localized defects on optical ellipsometry data. The measuring cell was developed and manufactured to create the conditions of free space, which allows to carry out experimental modeling correctly. The quasi-optical zero-ellipsometer control system and experimental results processing soft are modified. Attestation of the modified quasi-optical terahertz ellipsometer using the model graphite samples with known optical constants is carried out. Theoretical and experimental quasi-optical scale modeling of the influence of defects in the form of a parallelepiped is carried out. The results of the work can be used to improve the efficiency of diagnosis of radiation transformations on the surface of metals and alloys using optical ellipsometry and reflectometry. Product Description popup.authors Myla Diana Ye. Trotsenko Oleg G popup.nrat_date 2022-03-09 Close