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Information × Registration Number 0222U000768, 0119U100731 , R & D reports Title New approaches in the development of structural-sensitive X-ray spectrometry and diffractometry of complex crystalline compounds, thin film and nanosized layered systems popup.stage_title Head Fodchuk Ihor M., Доктор фізико-математичних наук Registration Date 18-01-2022 Organization Yuriy Fedkovych Chernivtsi National University popup.description2 Authors performed complex studies of the mechanisms and dynamics of structural changes occurring in epitaxial layers of iron yttrium garnets, subsurface layers of CdTe single crystals, CdхHg1-хTe epitaxial structures before and after implantation of arsenic ions and in porous silicon before and after ionic implantation of phosphorus. These studies were performed using the methods of double-crystal spectrometry and diffractometry, skew-asymmetric topography, atomic force microscopy and the method of mass spectrometry of secondary ions. The main objectives of the work were to create new original methods for quantifying the structural heterogeneity of crystalline compounds, as well as the nature of structural changes obtained by various external factors using X-ray multiwave diffractometry and diffraction of slow reflected electrons; development of new software products for processing experimental data in the case of various X-ray diffraction setups that will allow to detect structural changes in crystals exposed to external influences (athermic processes of microwave radiation, rapid heat treatment and ionizing radiation); development of theoretical foundations of multilevel processing experimental X-ray and electronic signals, containing the concept of calculation and analysis of additional signal levels, and providing the implementation of effective methods of filtering, approximation, local processing and analysis of signals using artificial intelligence, which are designed to compare images using of genetic algorithms and analysis of signal parameters using artificial neural networks; development and substantiation of a theoretical model for studying the morphology of the surface of CdTe crystals and its influence on the phenomena of charge transfer and mechanisms for detecting X- and γ-radiation. Product Description popup.authors Balovsyak Sergiy Vasyl'ovych Borcha Mariana D. Hutsulyak Ivan I Dovganyuk Volodymyr Vasyl'ovych Kotsyubynsky Volodymyr Olehovych Lytvyn Petro Marianovych Maslyanchuk Olena L. Roman Yuriy Todorovych Solodkyj Mykola Stepanovych popup.nrat_date 2022-03-09 Close