Search academic texts

Information × Registration Number 0309U003886, 0108U003868 , R & D reports Title Development of new complex approach to nanostructural characterization of semiconducting glassy materials for optoelectronics popup.stage_title Розроблення методології наноструктурної характеризації напівпровідникових склоподібних матеріалів оптоелектроніки дифракційними методами Head Kavetskyy Taras Stepanovych, Кандидат фізико-математичних наук Registration Date 28-12-2009 Organization Drohobych Ivan Franko State Pedagogical University popup.description2 Historical review on the problem of nanostructural characterization of semiconducting glassy materials is carried out. Evolution of atomic and void nanoscales in semiconducting glassy materials is illustrated. The methodology of nanostructural characterization of semiconducting glassy materials by diffraction methods (conventional x-ray diffraction in the region of the first sharp diffraction peak, high-energy synchrotron x-ray diffraction and extended x-ray absorpition fine structure spectroscopy) is developed. Radiation treatment of the samples of glassy semiconductors by gamma-quanta Co60 in the condition of the stationary radiation field with absorbed dose higher than 1 MGy is performed. Investigation of semiconducting glassy materials of optoelectronics by diffraction methods following the methodology developed is carried out. Product Description popup.authors Зайцев Олександр Вадимович Кавецький Орест Степанович Кавецький Тарас Степанович Лабовка Діана Василівна Паньків Ігор Степанович Паньків Людмила Іванівна Федиців Галина Володимирівна Цмоць Володимир Михайлович popup.nrat_date 2020-04-02 Close