1 documents found
Kryvyi Serhii Borisovich. High resolution X-ray diagnostic of the influence of deformations on structure of nanosize systems
: к.ф.-м.н. :
spec.. 01.04.07 - Фізика твердого тіла :
presented. 2017-11-15; popup.evolution: .;
Institute of Semiconductor Physics. – , 0417U004621.
1 documents found
Updated: 2026-03-20
