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Information × Registration Number 2103U000145, Article popup.category Стаття Title popup.author popup.publication 01-01-2003 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/1068 popup.publisher Видавництво СумДУ Description Experimental results of investigation of the strain sensitivity coefficient of the one- and three layered Cr , Cu and Sc based films are presented. The difference between strain sensitivity coefficient one and three-layered films has explain with scattering of conductivity electrons on external and internal surfaces of separate layers and boundaries of crystalline. popup.nrat_date 2025-03-24 Close