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Information × Registration Number 2107U000121, Article popup.category Стаття Title popup.author popup.publication 01-01-2007 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/2084 popup.publisher Видавництво СумДУ Description Within the frames of the modified Fuchs-Sondheimer model we have analyzed theoretically the effect of the longitudinal and the transverse strain-sensitivity of a double - layered singlecrystal film. We have obtained both the exact and asymptotical expressions for the coefficients of the strain-sensitivity (CS). We predict a non-monotonic behavior of the CS as a function of the ratio of the adjacent layer thicknesses. We obtain also that this behavior of the CS is sensitive to the characteristics of the charge carrier scattering at the interlayer interfaces. We perform a detailed calculation of the CS for the wide range of the layer thicknesses at various values of the parameters corresponding to the boundary scattering of the charge carriers. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/2084 popup.nrat_date 2025-03-24 Close
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: published. 2007-01-01; Сумський державний університет, 2107U000121
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Updated: 2026-03-20