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Information × Registration Number 2112U000417, Article popup.category Стаття Title popup.author popup.publication 01-01-2012 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/24882 popup.publisher Видавництво СумДУ Description [Fe (tFe) nm/Cu (tCu) nm]N multilayer films were prepared using pulsed-current electrodeposition method. The role of the pulsed-current deposition and Fe and Cu layer thicknesses on the magnetic properties was investigated. The microstructure of the multilayer films is dependent on the thicknesses of both the Fe and Cu layers. The saturation magnetization of the multilayers strongly correlated with the crystalline structure of Fe at the interface of Fe and Cu layers. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/24882 popup.nrat_date 2025-03-24 Close