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Information × Registration Number 2112U001414, Article popup.category Thesis Title popup.author popup.publication 01-01-2012 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/30130 popup.publisher Brookhaven National Laboratory Description We undertook a detailed investigation of the structural- and optical-properties of CdTe- and Cd1-xMnxTe-semiconductor films deposited by close-spaced vacuum sublimation using thermal evaporation on non-oriented substrates. From our structural- and phase-analysis of the layers, we obtained information on their structure, deformations, grain size, and content of dislocations for films deposited at different substrate temperatures. We considered that despite the presence of defects in the crystals, the films offer promise for fabrication into x-ray detectors. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/30130 popup.nrat_date 2025-05-12 Close