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Information × Registration Number 2196U000008, Article popup.category Стаття Title popup.author popup.publication 01-01-1996 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/1229 popup.publisher Видавництво СумДУ Description Temperature and size effects in thin films Co, Ni, Cr, Cu and Crfilms with Ge overlayer were investigated. Values straine coefficient of resistance and size dependence defining by the method of deformation. The experiment show, that Ge overlayer increase the resistivity of thin Cr films. This is linked with the exiton mechanizm of conductivity. popup.nrat_date 2025-03-24 Close