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Information × Registration Number 2197U000003, Article popup.category Стаття Title popup.author popup.publication 01-01-1997 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/2486 popup.publisher Видавництво СумДУ Description The size dependence of temperature coefficient of resistance (TCR) in double-layer Ti/Ni/S, Ni/Ti/S, Cu/Cr/S and a-Ge/Cr/S films (a - amorphous, S - substrate) has been researched. The difference between calculated and experimental values of TCR can be explained by interdiffusion processes and, in some cases, by formation of intermediate layer. The system a-Ge/Cr/S (electrical properties) can be considered as Cr film with overlayer. popup.nrat_date 2025-03-24 Close